Title :
ShOC rectifier: a new metal-semiconductor device with excellent forward and reverse characteristics
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol., New Delhi, India
Abstract :
We report a new structure, called the shielded ohmic contact (ShOC) rectifier which utilizes trenches filled with a high-barrier metal to shield an Ohmic contact during the reverse bias. When the device is forward biased, the ohmic contact conducts with a low forward drop. However, when reverse biased, the Ohmic contact is completely shielded by the high-barrier Schottky contact resulting in a low reverse leakage current. Two dimensional numerical simulation is used to evaluate and explain the superior performance of the proposed ShOC rectifier.
Keywords :
Schottky barriers; Schottky diodes; contact potential; leakage currents; ohmic contacts; semiconductor-metal boundaries; solid-state rectifiers; Schottky barrier; ShOC rectifier; forward voltage drop; high-barrier Schottky contact; high-barrier metal; metal-semiconductor device; reverse leakage current; shielded ohmic contact; Leakage currents; Ohmic contacts; Schottky barriers; Schottky diodes; Semiconductor-metal interfaces; Solid state rectifiers; Breakdown; Ohmic contact; Schottky barrier; diode; forward voltage drop; rectifier; reverse leakage current; simulation;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2004.841336