Title :
EEPROM as an analog storage device, with particular applications in neutral networks
Author :
Sin, Chi-Kai ; Kramer, Alan ; Hu, V. ; Chu, Robert R. ; Ko, Ping K.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
fDate :
6/1/1992 12:00:00 AM
Abstract :
The use of EEPROM as a compact, high-precision, nonvolatile, and reconfigurable analog storage element is investigated, with particular consideration given to the modifiable weight storage and analog multiplication problems in the hardware implementation of a neural network. Industry-standard digital EEPROM cells can be programmed to any analog value of threshold voltage, but programming characteristics of different devices on the same chip vary. The programming window of a single device also narrows with cycling. These phenomena necessitate the use of a feedback-based programming scheme. Stressing at high temperature suggests that charge retention is good even at 175°C. The linear variation of threshold voltage with temperature implies that temperature compensation of EEPROM is no more complicated than its conventional MOSFET counterpart. The drain current in the saturation region is found to be a quadratic function of drain voltage when the floating-gate-to-drain overlap capacitance is adequately large. A differential circuit that uses this property to generate the multiplication function required of neural net synapses is proposed
Keywords :
EPROM; MOS integrated circuits; analogue storage; circuit reliability; neural nets; 175 degC; EEPROM; analog multiplication problems; analog storage device; charge retention; cycling; differential circuit; digital EEPROM cells; double polysilicon NMOS technology; drain current; feedback-based programming scheme; high temperature stressing; modifiable weight storage; neural net synapses; neutral networks; nonvolatile reconfigurable storage element; programming characteristics; reliability; saturation region; temperature compensation; threshold voltage; Capacitance; EPROM; Equivalent circuits; Industrial control; Intelligent networks; Neural networks; Random access memory; Silicon compounds; Temperature; Threshold voltage;
Journal_Title :
Electron Devices, IEEE Transactions on