DocumentCode :
1195225
Title :
Multistep field plates for high-voltage planar p-n junctions
Author :
Feiler, Wolfgang ; Falck, Elmar ; Gerlach, Willi
Author_Institution :
Tech. Univ., Berlin, Germany
Volume :
39
Issue :
6
fYear :
1992
fDate :
6/1/1992 12:00:00 AM
Firstpage :
1514
Lastpage :
1520
Abstract :
Multistep field plates are often used to improve the blocking capability of planar p-n junctions. The electric field at the semiconductor surface below the field plate peaks, however, at every edge of the dielectric. In order to achieve the highest possible breakdown voltage at a given number of steps in the dielectric, their heights have to be adjusted as to equalize the corresponding peak fields. For this purpose, an analytical model has been developed, which relates the peak field to the geometrical and physical parameters of the structure. From this, a systematic method has been derived for designing multistep field plates with equal peak fields at the steps. By applying this method to a planar p-n junction the blocking capability was increased from 23% without field plates to more than 89% of the bulk breakdown voltage
Keywords :
impact ionisation; p-n homojunctions; power electronics; semiconductor device models; HV planar p-n junctions; analytical model; blocking capability; breakdown voltage; multistep field plates; peak field; reverse biased p+-n junction; surface electric field; Analytical models; Breakdown voltage; Dielectrics; Doping; Electric breakdown; Electrostatics; P-n junctions; Varactors;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.137334
Filename :
137334
Link To Document :
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