Title :
Testing of commercial optical media
Author :
Wong, James S. ; Fortunati, Leonard J. ; Hong, Benny ; Kluska, Alan P. ; Nebenzahl, Linda L. ; Mercado, Mark F. ; Rodriguez, Yolanda J. ; Yen, Yu-Sze
Author_Institution :
IBM, San Jose, CA, USA
fDate :
4/1/1992 12:00:00 AM
Abstract :
Data integrity is a primary concern for the users of any data storage medium. For optical data storage, the integrity is directly related to the performance and defect level of the storage media and to how they change as the media age. While media materials and thin-film stack designs are chosen with the goal of achieving high data integrity and reliability, variations in the media manufacturing processes themselves often can determine how the media will behave. These variations can be found through detailed and careful characterization testing. The authors describe some of the test methods used for characterizing rewritable media and discuss some results obtained while surveying commercially available media
Keywords :
ageing; computer equipment testing; data integrity; magneto-optical recording; optical disc storage; production testing; BER; CNR; ageing; amplitude uniformity; commercial optical media; data integrity; error domain size distribution; magneto-optic performance; manufacturing processes; optical data storage; reliability; rewritable media; testing; Disk drives; Image storage; Magnetooptic effects; Manufacturing processes; Memory; Nonlinear optics; Optical materials; Power lasers; Testing; Transistors;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on