Title :
Dynamic testing and diagnostics of A/D converters
Author :
Bossche, M. Vanden ; Schoukens, J. ; Renneboog, J.
fDate :
8/1/1986 12:00:00 AM
Abstract :
A method is derived to measure the integral and differential nonlinearity of an ADC using a sinewave with unknown amplitude and offset. The uncertainty of the measurement is also estimated. In a second phase, the integral nonlinearity is analyzed, using Walsh Transforms, to identify the nonlinearity at the bit level of the ADC.
Keywords :
A/D converters; ADC; Analog-to-digital conversion (ADC); Nonlinearities; Walsh transforms; Density functional theory; Digital signal processing; Frequency; Histograms; Measurement uncertainty; Sampling methods; Statistical analysis; Testing; Transfer functions; Voltage;
Journal_Title :
Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCS.1986.1086004
