• DocumentCode
    1198237
  • Title

    The effect of rise time and field gradient on nonlinear bit shift in thin film heads

  • Author

    Torabi, Adam F. ; Mallary, Michael L. ; Marshall, Steve

  • Author_Institution
    Digital Equipment Corp., Shrewsbury, MA, USA
  • Volume
    30
  • Issue
    6
  • fYear
    1994
  • fDate
    11/1/1994 12:00:00 AM
  • Firstpage
    3879
  • Lastpage
    3881
  • Abstract
    We present a discussion of nonlinear bit shift in thin film inductive heads. A three dimensional finite element model and two dimensional dynamic and self consistent model were used to calculate the nonlinear bit shift as a function of rise time, write current waveform and pole tip saturation. The analysis shows a strong dependency of nonlinear bit shift on rise time and write pole magnetic image. A comparison of experimental data with the theoretical model is presented
  • Keywords
    finite element analysis; magnetic heads; magnetic thin film devices; modelling; 2D dynamic model; 3D FEM model; field gradient; nonlinear bit shift; pole tip saturation; rise time; thin film inductive heads; three dimensional finite element model; write current waveform; write pole magnetic image; Channel coding; Delay; Finite element methods; Intersymbol interference; Magnetic flux; Magnetic heads; Saturation magnetization; Shape; Transistors; Writing;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.333931
  • Filename
    333931