DocumentCode
1198352
Title
The Effects of Electrostatic Discharge on Microelectronic Devices A Review
Author
Greason, William D. ; Castle, G. S Peter
Author_Institution
Faculty of Engineering Science, The University of Westein Ontario
Issue
2
fYear
1984
fDate
3/1/1984 12:00:00 AM
Firstpage
247
Lastpage
252
Abstract
Electrostatic discharge (ESD) can cause permanent and temporary failures in microelectronic devices. Protection networks are used on electrostatic discharge sensitive devices in order to raise their immunity to damage from ESD. A review is given of the causes and nature of ESD, including the case of discharge from the human body. A description of failure mechanisms is presented along with a summary of protection networks and techniques.
Keywords
Capacitance; Conductors; Electrostatic discharge; Immune system; Induction generators; Industry Applications Society; Microelectronics; Protection; Surface charging; Voltage;
fLanguage
English
Journal_Title
Industry Applications, IEEE Transactions on
Publisher
ieee
ISSN
0093-9994
Type
jour
DOI
10.1109/TIA.1984.4504404
Filename
4504404
Link To Document