Title :
Effect of very thin Cr-underlayer on the magnetic and recording properties of CoCrTa thin-film media
Author :
Lal, Brij B. ; Tobise, M. ; Shinohara, T.
Author_Institution :
HMT Technol., Fremont, CA, USA
fDate :
11/1/1994 12:00:00 AM
Abstract :
A process has been developed which uses very thin Cr-underlayer for CoCrTa-media for high-density recording. The media sputtered using this technique revealed that by decreasing Cr-underlayer thickness from 2000 Å to 200 Å, orientation-ratio increased from 1.27 to 1.6, squareness-ratio increased from 0.81 to 0.86, and Mrt increased from 3.25 to 3.97 memu/cm2. The Mr value is increased because of the higher squareness. The higher Mr gives a higher Mrt product which produced higher signal output by about 10%. Also, the noise performance was comparable for the media with thin and thick Cr-underlayers. X-ray diffraction patterns showed strong in-plane preferred orientations, Cr(200) and Co(112¯0) textures as a function of Cr-underlayer thickness
Keywords :
X-ray diffraction; chromium; chromium alloys; cobalt alloys; coercive force; ferromagnetic materials; magnetic disc storage; magnetic recording noise; magnetic thin film devices; magnetic thin films; sputtered coatings; tantalum alloys; 200 angstrom; CoCrTa-Cr; CoCrTa/Cr thin-film media; X-ray diffraction patterns; high-coercivity media; high-density recording; magnetic properties; noise performance; orientation-ratio; recording properties; signal output; sputter deposition; squareness-ratio; Chromium; Coercive force; Crystallography; Magnetic films; Magnetic noise; Magnetic properties; Magnetic recording; Sputtering; Substrates; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
