DocumentCode :
1198868
Title :
Thermal crisis: challenges and potential solutions
Author :
Shang, Li ; Dick, Robert P.
Volume :
25
Issue :
5
fYear :
2006
Firstpage :
31
Lastpage :
35
Abstract :
This paper describes integrated circuits (IC), which is denser, faster and cheaper. In the increasing system integration, as well as aggressive technology scaling, IC thermal issues now stand in the way of improved IC performance and by increasing transistors counts and aggressive frequency scaling result in as significant increase in chip-power density, and also its temperature. In order to avoid thermal crisis, we must simultaneously and cooperatively address thermal issues at each stage of the design process: during packaging and cooling design, architecture design, circuit design, fabrication and the development of novel devices
Keywords :
CMOS integrated circuits; cooling; integrated circuit design; integrated circuit packaging; thermal management (packaging); CMOS; IC thermal issue; cooling design; integrated circuit fabrication; packaging; Cooling; Microprocessors; Packaging; Resource management; Runtime; Temperature; Thermal conductivity; Thermal force; Thermal management; Thermal resistance;
fLanguage :
English
Journal_Title :
Potentials, IEEE
Publisher :
ieee
ISSN :
0278-6648
Type :
jour
DOI :
10.1109/MP.2006.1692283
Filename :
1692283
Link To Document :
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