DocumentCode :
1199959
Title :
Electronic Activity Dip Measurement
Author :
Ballato, Arthur ; Tilton, Richard
Volume :
27
Issue :
1
fYear :
1978
fDate :
3/1/1978 12:00:00 AM
Firstpage :
59
Lastpage :
65
Abstract :
The frequency- or immittance-temperature anomalies occurring in quartz-crystal resonators are generically called activity dips. Because of their potentially disastrous effects on oscillator and filter performance, testing for their presence can represent a considerable addition to the manufacturing cost. An electronic method is described, in several variations, that is rapid, simple, and well adapted to microprocessor control. The electronic method obviates tedious and costly temperature runs. It makes use of the fact that the desired mode of vibration is shifted in frequency by a variable series capacitor, while interfering modes, that cause activity dips, are nearly unaffected.
Keywords :
Capacitors; Costs; Electric variables control; Frequency; Manufacturing; Microprocessors; Oscillators; Resonator filters; Temperature; Testing;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1978.4314618
Filename :
4314618
Link To Document :
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