Title :
Magneto-optical Faraday effect probed in a scanning tunneling microscope
Author :
Prins, M.W.J. ; van der Wielen, M.C.M.M. ; Abraham, D.L. ; van Kempen, H. ; van Kesteren, H.W.
Author_Institution :
Nijmegen Univ., Netherlands
fDate :
11/1/1994 12:00:00 AM
Abstract :
Semiconductor tips are used as local photodetectors in a scanning tunneling microscope. We demonstrate that this configuration is sensitive to small light intensity variations, as supported by a simple model. The principle is applied to the detection of Faraday ellipticity of a Pt/Co multilayer sample. The outlook of this new technique in magneto-optical imaging is briefly discussed
Keywords :
Faraday effect; cobalt; magnetic multilayers; photodetectors; platinum; scanning tunnelling microscopy; Faraday ellipticity; Pt-Co; Pt/Co multilayer sample; light intensity variations; local photodetectors; magneto-optical Faraday effect; magneto-optical imaging; scanning tunneling microscope; semiconductor tips; Faraday effect; Laboratories; Magnetic force microscopy; Magnetic semiconductors; Magnetooptic effects; Optical imaging; Optical microscopy; Optical sensors; Semiconductivity; Tunneling;
Journal_Title :
Magnetics, IEEE Transactions on
