• DocumentCode
    1200147
  • Title

    Embedded-memory test and repair: infrastructure IP for SoC yield

  • Author

    Zorian, Yervant ; Shoukourian, Samvel

  • Volume
    20
  • Issue
    3
  • fYear
    2003
  • Firstpage
    58
  • Lastpage
    66
  • Abstract
    Today´s complex SoCs need sophisticated infrastructure IP, not only to test and diagnose embedded memories but also to repair them and improve fabrication yield. The authors solution integrates memory IP with test and repair IP in a composite infrastructure IP that ensures manufacturing and field repair efficiency and optimizes SoC yield.
  • Keywords
    built-in self test; integrated circuit testing; integrated memory circuits; system-on-chip; SoC yield; embedded-memory test; fabrication yield; field repair; infrastructure IP; Algorithm design and analysis; Design optimization; Fabrication; Failure analysis; Feedback loop; Logic design; Logic testing; Manufacturing; Qualifications; Random access memory;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2003.1198687
  • Filename
    1198687
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1200147