Author :
Lavagno, Luciano ; Fix, Limor
Author_Institution :
Cadence Berkeley Labs
Keywords :
Circuit noise; Circuit synthesis; Circuit testing; Computer science; Design automation; Dynamic voltage scaling; Electronic design automation and methodology; Formal verification; Hardware; Threshold voltage;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2003.1198690