DocumentCode :
1200193
Title :
Use of a Microprocessor in Digital Testing
Author :
Ng, Chi-Ho
Volume :
27
Issue :
2
fYear :
1978
fDate :
6/1/1978 12:00:00 AM
Firstpage :
137
Lastpage :
140
Abstract :
The use of a microprocessor as a controller in digital testing is usually restricted by the relatively low operating speed of the microprocessor. Two different approaches to building a microprocessor-based digital test system are discussed and compared in this paper. It is found that if a high-speed test pattern repetition rate is not a necessary requirement, the semidynamic approach which tests and analyzes the UUT on a real-time basis will result in a faster and simpler configuration.
Keywords :
Control systems; Costs; Digital control; Digital systems; Electrical equipment industry; Logic design; Microprocessors; Pattern analysis; Performance evaluation; System testing;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1978.4314644
Filename :
4314644
Link To Document :
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