• DocumentCode
    120027
  • Title

    Analysis of reflection and scattering characteristics at the 60GHz frequency

  • Author

    Myoung-Won Jung ; Jong Ho Kim ; Young Keun Yoon ; Young Jun Chong

  • Author_Institution
    Technol. Res. Dept., ETRI, Daejeon, South Korea
  • fYear
    2014
  • fDate
    16-19 Feb. 2014
  • Firstpage
    442
  • Lastpage
    446
  • Abstract
    This paper presents the analysis result of reflection and scattering characteristics for propagation prediction at the 60GHz frequency. Because the millimeter wave band has very short wavelength within a few millimeter, the scattering characteristic is occurred by the small roughness of the surface of a wall on indoor environment. In addition, because the propagation characteristics appear differently by the surface roughness of mediums, the propagation prediction is very difficult. Therefore, the scattering characteristics according to the surface roughness should be analysed for accurate propagation prediction. To predict the propagation characteristics in the indoor environments, we should have studied changes in the accordance with the rough surface. This paper analyses the reflection and scattering characteristics by the surface roughness of mediums in millimeter wave band, and studies the method for applying to the propagation prediction.
  • Keywords
    computational electromagnetics; electromagnetic wave reflection; electromagnetic wave scattering; millimetre wave propagation; ray tracing; surface roughness; frequency 60 GHz; indoor wall environment; millimeter wave band; propagation prediction; reflection characteristics analysis; scattering characteristics analysis; surface roughness; Equations; Mathematical model; Reflection; Rough surfaces; Scattering; Surface roughness; Surface waves; millimeter wave; ray-tracing; reflection characteristic; scattering characteristic; surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Communication Technology (ICACT), 2014 16th International Conference on
  • Conference_Location
    Pyeongchang
  • Print_ISBN
    978-89-968650-2-5
  • Type

    conf

  • DOI
    10.1109/ICACT.2014.6778999
  • Filename
    6778999