Title :
DC biased capacitance method for measuring thin film magnetostriction and ΔE effect
Author :
Lee, Y.H. ; Shin, Y.D. ; Herr, P.H. ; Lee, K.H. ; Kim, H.J. ; Han, S.H. ; Kang, I.K. ; Rhee, J.R.
Author_Institution :
Phys. Dept., Jeonbuk Nat. Univ., Jeonju, South Korea
fDate :
11/1/1994 12:00:00 AM
Abstract :
This paper reports a method for measuring magnetostriction, Young´s modulus of a substrate or film, and the ΔE effect with one apparatus. A substrate with a thin magnetic film deposited on it is in parallel with and cantilevered above a metal plate electrode, and they form a capacitive cell. The cantilever deflects due to its own weight and applied electric and magnetic fields. The small change of capacitance caused by this deflection is measured by a sensitive capacitance bridge. Young´s modulus, magnetostriction, and ΔE effect can be calculated by a theoretical analysis with the measured deflection data
Keywords :
Young´s modulus; magnetic thin films; magnetic variables measurement; magnetostriction; ΔE effect; DC biased capacitance; Young´s modulus; capacitance bridge; magnetostriction; substrate; thin film; Bridge circuits; Capacitance measurement; Glass; Magnetic field measurement; Magnetic fields; Magnetic films; Magnetostriction; Substrates; Transistors; Voltage;
Journal_Title :
Magnetics, IEEE Transactions on
