Flexible test system for measurement of magnetoresistance in ferromagnetic films

Author

Franzel, Kenneth S. ; Dee, Richard H.

Author_Institution

Storage Technol. Corp., Louisville, CO, USA

Volume

30

Issue

6

fYear

1994

fDate

11/1/1994 12:00:00 AM

Firstpage

4575

Lastpage

4577

Abstract

A simple, yet versatile magnetoresistance (MR) measurement tester is described. Details of system operation and examples of measurement capability are discussed. The system was designed to measure magnetoresistance on a variety of samples ranging from patterned films on magnetic and nonmagnetic substrates to completed shielded MR heads using readily available standard instrumentation. Data presentation includes plots of magnetoresistance vs. applied field, the derivative of magnetoresistance, and numerical analysis of information from the curve such as hysteresis, dR_max, H_c, bias field, maximum gradient dR/dH, and Barkhausen noise. High speed capture of MR curve data reduces thermal drift problems. Export of data in standard formats allows further analysis on the PC

Keywords

Barkhausen effect; computerised instrumentation; ferromagnetic materials; magnetic hysteresis; magnetic thin films; magnetic variables measurement; magnetoresistance; Barkhausen noise; applied field; bias field; ferromagnetic films; hysteresis; magnetoresistance measurement; patterned films; shielded heads; thermal drift; Instruments; Magnetic field measurement; Magnetic films; Magnetic heads; Magnetic hysteresis; Magnetic shielding; Magnetoresistance; Measurement standards; Numerical analysis; System testing;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.334153

Filename

334153