Title :
Optical network testbed-key enabler in developing current and future network solutions
Author :
Vukovic, Alex ; Wu, Jing ; Savoie, Michel ; Hua, Heng ; Campbell, Scott ; Zhang, Hanxi
Author_Institution :
Commun. Res. Centre, Ottawa, Ont., Canada
Abstract :
The all-optical network (AON) demonstrator is a trial system-level testbed for the validation and verification of key network building blocks, scalable architectures, as well as control and management solutions for next-generation wavelength division multiplexing (WDM) networks. Developed at the Communications Research Centre (CRC) in Ottawa, ON, Canada, the AON testbed has already validated certain system-level concepts at the physical and upper layers. The paper describes the crucial role of the AON testbed in research, development, and "proof of concept" for both emerging optical technologies at the physical layer (performance characterization) and customer-managed networks at the upper layer (network management). Moreover, it is expected that the AON testbed will continue to be a valuable playground for future developments of emerging technologies, solutions, and applications.
Keywords :
optical fibre networks; telecommunication network management; wavelength division multiplexing; all-optical network demonstrator; customer-managed networks; key network building blocks; network control solutions; network management solutions; network solutions; network validation; network verification; next-generation WDM networks; optical network testbed; optical technologies; scalable architectures; system-level testbed; wavelength division multiplexing; All-optical networks; Communication system control; Control systems; Cyclic redundancy check; Next generation networking; Optical fiber networks; Paper technology; System testing; WDM networks; Wavelength division multiplexing; All-optical networks (AONs); network management; optical network testbed; optical performance monitoring; user-controlled lightpath provisioning (UCLP);
Journal_Title :
Lightwave Technology, Journal of
DOI :
10.1109/JLT.2005.856256