Current criticalities and innovation perspectives in flash memory design automation

Author

Conci, Armando ; Faldarini, Anna ; Fumagalli, Gaspare ; Girardi, Antonio ; Pesare, Marcello ; Tecli, Nicola ; Zucchinali, Massimo

Author_Institution

MPG Flash Div., STMicroelectronics, Agrate Brianza, Italy

Volume

91

Issue

4

fYear

2003

fDate

4/1/2003 12:00:00 AM

Firstpage

581

Lastpage

593

Abstract

With reference to technological, architectural, and market considerations, the specific areas of design methodology and automation in flash memory design are analyzed in this paper. For each of the activities identified as critical, we show the design process key constraints and specifications, which drive the change in methodology, tools, and flows. We go through a brief survey of the solutions adopted in the recent past as well as the new emerging areas of intervention. The analysis covers: 1) design methodology, floorplanning, full-custom layout design and Rtl2Layout automation integration; 2) analog-digital mixed full-chip simulation and architectural exploration; 3) statistical analog circuital simulation; 4) mixed-signal design to test approaches; and 5) IC and package design integration.

Keywords

circuit layout CAD; circuit simulation; design for testability; flash memories; integrated circuit layout; integrated circuit packaging; memory architecture; mixed analogue-digital integrated circuits; IC design integration; Rtl2 layout automation integration; analog-digital mixed full-chip simulation; architectural considerations; architectural exploration; current criticalities; design methodology; design process constraints; flash memory design automation; floorplanning; full-custom layout design; innovation perspectives; market considerations; mixed-signal design to test; package design integration; package signal integrity analysis; statistical analog circuital simulation; Analog-digital conversion; Analytical models; Automatic testing; Circuit simulation; Circuit testing; Design automation; Design methodology; Flash memory; Process design; Technological innovation;

fLanguage

English

Journal_Title

Proceedings of the IEEE

Publisher

ieee

ISSN

0018-9219

Type

jour

DOI

10.1109/JPROC.2003.811710

Filename

1199085