• DocumentCode
    1202811
  • Title

    Wide-band digital tan-δ meter using a phase comparison system

  • Author

    Saegusa, Takeo ; Hagiwara, Nobumi ; Suzuki, Yoshihisa ; Murase, Hideaki

  • Volume
    29
  • Issue
    4
  • fYear
    1980
  • Firstpage
    342
  • Lastpage
    345
  • Abstract
    The demand for precision in measurement of dielectric loss (tan δ), which is important to clarify the electrical characteristics of dielectrics of capacitors, etc., is increasingly becoming raised in level these days. The authors have published a direct-reading system of tan δ using the phase comparison method and developed a digital tan-δ meter based on the above. The next experiment was construction of a more compact sized all-electronic-type automatic digital tan-δ meter by using a MOSFET as the resistance element for the direct reading of tan δ. As the result of repeated investigations on the main circuits, an automatic digital tan-δ meter was successfully produced having a precision of 10-3- 10-4 at several 10 Hz-several 100 kHz.
  • Keywords
    Dielectric loss measurement; Dielectric losses; Dielectric measurements; Electric variables measurement; Loss measurement; MOSFET circuits; Measurement standards; Phase measurement; Voltage; Wideband;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1980.4314949
  • Filename
    4314949