DocumentCode :
1204571
Title :
Deep-Level Spectroscopy by Transient Capacitance Techniques under Electrical Resonance
Author :
Izpura, Jose Ignacio ; Herrero, Jose Miguel ; Sandoval, Francisco ; Calleja, Enrique ; La Cruz, Adalberto ; Munoz, Elias
Volume :
33
Issue :
1
fYear :
1984
fDate :
3/1/1984 12:00:00 AM
Firstpage :
16
Lastpage :
18
Abstract :
Transient capacitance studies for deep-level spectroscopy are suggested to be performed under electrical resonance conditions. Variable-frequency impedance bridges allow work at resonance, and an incremental gain for capacitance transients is obtained. This new method is presented and a few examples are discussed.
Keywords :
Bridge circuits; Capacitance; Electrons; Numerical analysis; Power measurement; Pulse amplifiers; Pulse modulation; Resonance; Solid state circuits; Spectroscopy;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1984.4315143
Filename :
4315143
Link To Document :
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