• DocumentCode
    1207398
  • Title

    The Transient Response of Transistors and Diodes to Ionizing Radiation

  • Author

    Wirth, J.L. ; Rogers, S.C.

  • Author_Institution
    Sandia Laboratory Albuquerque, New Mexico
  • Volume
    11
  • Issue
    5
  • fYear
    1964
  • Firstpage
    24
  • Lastpage
    38
  • Abstract
    Mathematical models describing the response of diodes and transistors to ionizing radiation are derived from the continuity and diffusion equations and, in the case of the transistor, the charge control model. Solutions are obtained for both steady-state and transient radiation environments. In addition to being of use in understanding device behavior, these solutions also indicate those device parameters which must be optimized to reduce transient response and therefore provide criteria for the design and/or selection of devices with minimum response. A model is also presented which describes the nonlinear effect of collector multiplication upon the collector photocurrent of a transistor. This model is used as a basis for explaining and predicting the nonlinear relation between the peak photo-response and the radiation dose which has been observed in some devices.
  • Keywords
    Charge carrier processes; Gamma rays; Geometry; Ionizing radiation; Mathematical model; Photoconductivity; Semiconductor diodes; Semiconductor materials; Silicon; Transient response;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS2.1964.4315472
  • Filename
    4315472