Simulation and Verification of Transient Nuclear Radiation Effects on Semiconductor Electronics

This paper demonstrates a technique of modeling semiconductor devices with a comrpatible circuit analysis program using an IBM 7094 digital computer and an S - C - 4020 for CRT display. The models and program contain means of simulating the effect of an ionizing radiation environment. Both modeling and programming are facilitated by the use of a general-purpose compiler and solver termed TRAC (Transient Radiation Analysis by Computer). Comparison between TRAC simulation and experimental test results demonstrate close agreement at the indicated radiation levels. Methods for determining the semiconductor device parameter values from test data are illustrated. Likewise, TRAC program capability is tabulated with a circuit example illustrating application of the technique. A brief description of "Equation Writing Capability" is included with an example of input data required for this option.