DocumentCode :
1209094
Title :
High resistivity InP:Ti,Be by GSMBE
Author :
Salaun, S. ; Gauneau, M. ; Le Corre, A. ; Mottet, Serge ; Viallet, J.E.
Author_Institution :
CNET, Lannion
Volume :
30
Issue :
24
fYear :
1994
fDate :
11/24/1994 12:00:00 AM
Firstpage :
2076
Lastpage :
2077
Abstract :
The authors report the growth, by GSMBE and the semi-insulating behaviour of codoped InP:Ti,Be with high resistivities up to 4×10 7 Ωcm. Current-voltage measurements have been performed and good agreement has been found between experiment and theory using numerical simulation tools
Keywords :
III-V semiconductors; beryllium; chemical beam epitaxial growth; electrical conductivity; indium compounds; semiconductor epitaxial layers; semiconductor growth; titanium; GSMBE; InP:Ti,Be; current-voltage measurements; gas source MBE; numerical simulation tools; optoelectronic devices; resistivities; semi-insulating behaviour;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19941395
Filename :
338021
Link To Document :
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