• DocumentCode
    1209663
  • Title

    A theoretical analysis of relativistic klystron oscillators

  • Author

    Uhm, Han Sup

  • Author_Institution
    Naval Surface Warfare Center, Silver Spring, MD, USA
  • Volume
    22
  • Issue
    5
  • fYear
    1994
  • fDate
    10/1/1994 12:00:00 AM
  • Firstpage
    706
  • Lastpage
    712
  • Abstract
    An electron beam pre-modulated at the first cavity in a klystron enters the second cavity opening, exciting it. Induced voltage at the second cavity in a high-power klystron forms a virtual cathode momentarily, sending back a part of the beam toward the first cavity. The relationship between the induced voltage and the return current at the first cavity is investigated. The boundary between the amplifier and oscillator operation regions is described in the parameter space defined by the return current strength and inter-cavity distance. Nonlinear saturation mechanism of the first cavity excitation is investigated for the oscillator operation region. One of the key saturation mechanisms of the cavity excitation is that the location at which the maximum current modulation occurs starts to shift toward the first cavity, if the induced voltage at the first cavity increases significantly. The saturation amplitude of the induced voltage is an increasing function of the beam intensity and energy, but it is independent of the return current
  • Keywords
    cavity resonators; klystrons; microwave generation; microwave oscillators; relativistic electron beam tubes; beam intensity; cavity excitation; current modulation; induced voltage; inter-cavity distance; nonlinear saturation mechanism; oscillator operation region; relativistic klystron oscillators; return current strength; saturation amplitude; virtual cathode; Cathodes; Electron beams; Frequency; High power amplifiers; Intensity modulation; Klystrons; Operational amplifiers; Optical modulation; Oscillators; Voltage;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.338286
  • Filename
    338286