Title :
In-circuit functional or emulation - choosing the right test solution
Author_Institution :
Ministry of Defence, Procurement Executive, Bath, UK
fDate :
6/1/1986 12:00:00 AM
Abstract :
This paper provides an overview of the current developments in general-purpose automatic test equipment (GPATE) and examines some of the pitfalls in its use. It reviews the range of types of GPATE currently available, explores the latest developments in GPATE technology and looks ahead to some of the advances in digital and analogue techniques, as related to the needs of GPATE systems.
Keywords :
automatic test equipment; electronic equipment testing; integrated circuit testing; GPATE; IC testing; analogue techniques; automatic test equipment;
Journal_Title :
Computer-Aided Engineering Journal
DOI :
10.1049/cae:19860026
