DocumentCode :
1210492
Title :
The Joint Test Action Group
Author :
Maunder, Colin
Author_Institution :
British Telecom, Research Laboratories, Ipswich, UK
Volume :
3
Issue :
4
fYear :
1986
fDate :
8/1/1986 12:00:00 AM
Firstpage :
121
Lastpage :
122
Keywords :
automatic test equipment; integrated circuit testing; IC complexity; IC users; JTAG; Joint Test Action Group; automatic test equipment; surface-mount technology;
fLanguage :
English
Journal_Title :
Computer-Aided Engineering Journal
Publisher :
iet
ISSN :
0263-9327
Type :
jour
DOI :
10.1049/cae.1986.0033
Filename :
4806972
Link To Document :
بازگشت