Title :
The Joint Test Action Group
Author_Institution :
British Telecom, Research Laboratories, Ipswich, UK
fDate :
8/1/1986 12:00:00 AM
Keywords :
automatic test equipment; integrated circuit testing; IC complexity; IC users; JTAG; Joint Test Action Group; automatic test equipment; surface-mount technology;
Journal_Title :
Computer-Aided Engineering Journal
DOI :
10.1049/cae.1986.0033