• DocumentCode
    1213232
  • Title

    A fuzzy-logic based optical sensor for online weld defect-detection

  • Author

    Naso, David ; Turchiano, Biagio ; Pantaleo, Paolo

  • Author_Institution
    Dipt. di Elettrotecnica ed Elettronica, Politecnico di Bari, Italy
  • Volume
    1
  • Issue
    4
  • fYear
    2005
  • Firstpage
    259
  • Lastpage
    273
  • Abstract
    This paper describes an intelligent optical sensor for real time defect detection in gas metal arc welding processes. The sensor measures the radiations emitted by the plasma surrounding the welding arc, and analyzes the information in real time to determine an index of local quality of the weld. The data processing algorithm encompasses a Kalman filter to reduce the heavy amount of noise affecting the measured signals, and an intelligent fuzzy system to assess the degree of acceptability of the weld. The fuzzy system is also able to detect the risk of specific problems (e.g., anomalies in the current, voltage or speed of the arc, contamination with other materials, holes) and the position of defects along the welding line. In an extensive experimental comparison, the fuzzy system outperforms a former version of the detection algorithm based on a statistical approach.
  • Keywords
    Kalman filters; arc welding; fault diagnosis; formal logic; fuzzy systems; intelligent sensors; optical sensors; welding; Kalman filter; arc welding process; electrooptical sensors; fuzzy logic based optical sensor; intelligent fuzzy system; intelligent optical sensor; online weld defect-detection; plasma analysis; real time defect detection; welding arc; Data processing; Fuzzy systems; Information analysis; Intelligent sensors; Noise reduction; Optical sensors; Plasma materials processing; Plasma measurements; Plasma welding; Pollution measurement; Arc welding; electro-optical sensors; fuzzy logic; plasma analysis;
  • fLanguage
    English
  • Journal_Title
    Industrial Informatics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1551-3203
  • Type

    jour

  • DOI
    10.1109/TII.2005.857617
  • Filename
    1532160