The effects of alkali metal diffusion on zinc phosphide thin films

Author

Paquin, Brooke ; Cimaroli, Alex ; Yanfa Yan

Author_Institution

Dept. of Phys. & Astron., Univ. of Toledo, Toledo, OH, USA

fYear

2014

fDate

8-13 June 2014

Abstract

Zinc phosphide (Zn₃P₂) thin films are grown by close-spaced sublimation. Three substrates were chosen to grow thin films: soda lime glass, mica, and quartz. C-V measurements were performed to determine the majority charge carrier concentration of the 2-5μm Zn₃P₂ thin films. Quartz (no alkali metals) had an average charge carrier density of 1×10¹⁵ cm^-3; whereas mica (some alkali metals) had 3 times the carrier density of quartz. The concentration of charge carriers for soda-lime glass substrates could not be determined due to a bad junction with Magnesium. This is potentially related to the high concentration of sodium in soda-lime glass.

Keywords

alkali metals; carrier density; glass; mica; quartz; semiconductor thin films; solar cells; zinc compounds; C-V measurements; Zn₃P₂; alkali metal diffusion; charge carrier concentration; charge carrier density; close-spaced sublimation; mica; photovoltaic cells; quartz; soda-lime glass substrates; zinc phosphide thin films; Charge measurement; Doping; Educational institutions; Glass; Metals; X-ray scattering; alkali metal doping; charge carrier concentration; photovoltaic cells; thin film; zinc phosphide;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th

Conference_Location

Denver, CO

Type

conf

DOI

10.1109/PVSC.2014.6924872

Filename

6924872