DocumentCode
1214232
Title
Micromachined silicon electrolytic conductivity probes with integrated temperature sensor
Author
He, Dongming ; Shannon, Mark A. ; Miller, Norman R.
Author_Institution
Assembly Technol. Dev., Intel Corp., Chandler, AZ, USA
Volume
5
Issue
6
fYear
2005
Firstpage
1185
Lastpage
1196
Abstract
Electrolytic conductivity measurements of fluids currently require sample volumes greater than a milliliter. Many applications would benefit from accurate measurements of nano- to microliter sample volumes. However, polarization and nonlinear electrode impedance effects, along with stray impedance and temperature effects, strongly affect measurements of the solution conductance for microliter and smaller sample volumes. MEMS-based silicon electrolytic conductivity probes, down to 100-μm wide, with integrated temperature sensors, have been designed and fabricated to overcome these effects. Several electrode configurations were tested: plain electrode pairs, electrode pairs plated with platinum black, plain four electrode sets, and four electrode sets plated with platinum black were investigated. The same accuracy as normal scale probes has been achieved with these sensors over almost three orders of magnitude in solution concentration and electrolytic conductivity ranges.
Keywords
electrical conductivity; electrochemical sensors; electrolytic devices; microelectrodes; micromachining; silicon; temperature sensors; MEMS; deep reactive ion etching; electrode pairs; electrolytic conductivity measurements; four-electrode measurement; integrated temperature sensor; microelectrode; micromachined silicon electrolytic conductivity probes; micromachining; nonlinear electrode impedance effects; platinum black; polarization effects; resistive temperature device; solution concentration; Conductivity measurement; Electrodes; Impedance measurement; Platinum; Polarization; Probes; Silicon; Temperature sensors; Testing; Volume measurement; Deep reactive ion etching (DRIE); double layer; electrode impedance; electrolytic conductivity; four-electrode measurement; micromachining; platinum black; resistive temperature device (RTD);
fLanguage
English
Journal_Title
Sensors Journal, IEEE
Publisher
ieee
ISSN
1530-437X
Type
jour
DOI
10.1109/JSEN.2005.855596
Filename
1532256
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