Title :
1994 IEEE Nuclear and Space Radiation Effects Conference (NSREC ´94)
Abstract :
The following topics were dealt with: basic mechanisms of radiation effects; radiation effects on photonic systems; single-event charge collection phenomena; dosimetry and radiation facilities; single-event device effects; isolation technologies; spacecraft environments and effects; radiation effects in devices and integrated circuits; hardness assurance and testing techniques
Keywords :
dosimetry; integrated circuit testing; isolation technology; optoelectronic devices; radiation effects; radiation hardening (electronics); semiconductor device testing; spacecraft charging; dosimetry; hardness assurance; integrated circuits; isolation technologies; nuclear radiation effects; photonic systems; radiation facilities; radiation hardness testing; single-event charge collection phenomena; single-event device effects; space radiation effects; spacecraft environments; Extraterrestrial radiation effects; Integrated circuit radiation effects; Integrated circuit testing; Nuclear radiation effects; Optoelectronic devices; Radiation detectors; Radiation effects; Semiconductor device radiation effects; Semiconductor device testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
