DocumentCode :
1216240
Title :
A simple algorithm for predicting proton SEU rates in space compared to the rates measured on the CRRES satellite
Author :
Reed, R.A. ; McNulty, P.J. ; Beauvais, W.J. ; Abdel-Mader, W.G. ; Stassinopoulos, E.G. ; Barth, J. C L
Author_Institution :
Dept. of Phys. & Astron., Clemson Univ., SC, USA
Volume :
41
Issue :
6
fYear :
1994
Firstpage :
2389
Lastpage :
2395
Abstract :
A new simulation code, the Clemson Omnidirectional Spallation Model for Interaction in Circuits (COSMIC), is described and its predictions agree with SEU data from four devices flown as part of the microelectronics package experiment on the CRRES satellite. The code uses CUPID for determining the energy depositions in the sensitive volumes. It allows proton exposures with arbitrary angles of incidence including random omnidirectional exposure; and the user specifies the thickness of shielding on six sides of the sensitive volume. COSMIC is used as part of an algorithm developed to predict the rate proton induced single event upsets occur in the space radiation environment given by AP-8. In testing the algorithm, the position coordinates are taken from the satellite´s ephemeris data, but calculations based on position coordinates from orbital codes were also in agreement with the measured values.<>
Keywords :
DRAM chips; circuit analysis computing; digital simulation; integrated circuit modelling; proton effects; shielding; space vehicle electronics; COSMIC; CRRES satellite; CUPID; Clemson omnidirectional spallation model for interaction in circuits; DRAM chips; energy depositions; microelectronics package experiment; position coordinates; proton SEU rates; proton exposures; random omnidirectional exposure; shielding; single event upsets; space radiation environment; Circuit simulation; Microelectronics; Orbital calculations; Packaging; Prediction algorithms; Predictive models; Protons; Satellites; Single event upset; Testing;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.340592
Filename :
340592
Link To Document :
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