Title :
A technique for real-time measurement of Nth-order derivatives dNV/dIN
Author :
Swartz, Robert G.
Author_Institution :
AT&T Bell Lab., Holmdel, NJ, USA
fDate :
8/1/1989 12:00:00 AM
Abstract :
A technique for the measurement of device derivatives d NV/dIN of arbitrary order N described. Measurement is accomplished by injecting a test current composed of the sum of N square waves into the rest device, and then multiplying the corresponding voltage change by the product of those same square waves, followed by low-pass filtering. The algorithm is implemented in real time using a mixture of analog and digital circuitry, and its application to semiconductor laser control in high-speed optical communications is described
Keywords :
optical communication equipment; optical links; semiconductor junction lasers; Nth-order derivatives; high-speed optical communications; low-pass filtering; real time; real-time measurement; semiconductor laser control; square waves; test current; Circuits; Current measurement; Filtering; Laser applications; Low pass filters; Optical control; Optical filters; Semiconductor lasers; Testing; Voltage;
Journal_Title :
Solid-State Circuits, IEEE Journal of
