DocumentCode :
1217437
Title :
Coupled noise analysis for adjacent vias in multilayered digital circuits
Author :
Gu, Qizheng ; Tassoudji, M. Ali ; Poh, Soon Y. ; Shin, Robert T. ; Kong, Jin Au
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
Volume :
41
Issue :
12
fYear :
1994
fDate :
12/1/1994 12:00:00 AM
Firstpage :
796
Lastpage :
804
Abstract :
The electromagnetic coupling between two adjacent vias in a multilayered integrated circuit is analyzed by means of equivalent magnetic frill array models incorporated with the even- and odd-mode approach. Closed-form expressions for the coupled noise on the passive via are derived. The coupling responses in the frequency domain and crosstalk waveforms in the time domain for some multilayered via structures are calculated based on these formulas. A 4-layer experimental model is constructed and measurements are taken for the transmission, reflection, and coupling responses. The measurements show good agreement with the calculated results over a frequency range of up to 18 GHz
Keywords :
crosstalk; digital integrated circuits; distributed parameter networks; frequency-domain analysis; integrated circuit noise; linear network analysis; time-domain analysis; transmission line theory; 18 GHz; adjacent vias; coupled noise analysis; coupling responses; crosstalk waveforms; electromagnetic coupling; equivalent magnetic frill array models; even-mode approach; frequency domain; multilayered digital circuits; multilayered integrated circuit; odd-mode approach; passive via; reflection response; time domain; transmission response; Circuit analysis; Coupling circuits; Crosstalk; Electromagnetic analysis; Electromagnetic coupling; Integrated circuit modeling; Integrated circuit noise; Magnetic analysis; Magnetic domains; Magnetic noise;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
Publisher :
ieee
ISSN :
1057-7122
Type :
jour
DOI :
10.1109/81.340842
Filename :
340842
Link To Document :
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