DocumentCode :
1218789
Title :
Analysis of Solder Joint Failure Criteria and Measurement Techniques in the Qualification of Electronic Products
Author :
Qi, Haiyu ; Vichare, Nikhil M. ; Azarian, Michael H. ; Pecht, Michael
Author_Institution :
Dell, Inc., Round Rock, TX
Volume :
31
Issue :
2
fYear :
2008
fDate :
6/1/2008 12:00:00 AM
Firstpage :
469
Lastpage :
477
Abstract :
The specification of a failure criterion for solder joints is an important element in the qualification of an electronic product. A common approach to reliability testing is to monitor electrical resistance during the testing. The techniques employed for resistance monitoring and data acquisition will determine whether information regarding transients or long-term drift is captured by the measurement. This paper reviews and assesses the failure criteria used in industry and academia, focusing on three key attributes: resistance threshold, duration of resistance change, and frequency of changes. An experimental study on thermomechanical fatigue of ball grid array package solder joints was performed to compare measurement techniques and failure criteria.
Keywords :
ball grid arrays; electric resistance measurement; failure analysis; fatigue testing; life testing; solders; accelerated testing; ball grid array; data acquisition; electrical resistance monitoring; electronic product qualification; life testing; reliability testing; resistance change; resistance threshold; solder joint failure criteria; thermomechanical fatigue; Accelerated testing; ball grid array (BGA); interconnects; reliability; solder;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.2008.921647
Filename :
4520017
Link To Document :
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