• DocumentCode
    122231
  • Title

    P+ layer effects on a-Si:H solar cell performance

  • Author

    Kibum Kim ; Yue Kuo

  • Author_Institution
    Thin Film Nano & Microelectron. Res. Lab., Texas A&M Univ., College Station, TX, USA
  • fYear
    2014
  • fDate
    8-13 June 2014
  • Firstpage
    3055
  • Lastpage
    3059
  • Abstract
    Influences of the p+ layer, i.e., deposition condition, post-deposition annealing, thin film deposition sequence, internal light reflection, electrode film quality, and SiNX chamber pretreatment on the a-Si:H solar cell performance have been studied. The conversion efficiency is improved using the pin stack structure with a high final annealing temperature and a high reflective bottom electrode due to the decrease of the contact resistance, the reduction of defects in the film, the increase of the hole transport efficiency, the improvement of light absorption, and the minimum cross contamination. The high solar cell efficiency was obtained by optimizing the p+ related film process.
  • Keywords
    annealing; contact resistance; hydrogen; light refraction; silicon compounds; solar cells; Si:H; SiNX; annealing temperature; chamber pretreatment; contact resistance; conversion efficiency; electrode film quality; hole transport efficiency; internal light reflection; light absorption; minimum cross contamination; p+ layer effects; pin stack structure; post-deposition annealing; reflective bottom electrode; solar cell performance; thin film deposition sequence; Absorption; Annealing; Current measurement; Hydrogen; Photovoltaic cells; Pollution measurement; ITO sheet resistance; PECVD; a-Si:H solar cell; chamber treatment; deposition sequence; light reflection; p+ deposition; post-deposition annealing; power conversion efficiency;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/PVSC.2014.6925580
  • Filename
    6925580