DocumentCode :
1223292
Title :
A silicon drift photodiode
Author :
Avset, B.S. ; Ellison, J.A. ; Evensen, L. ; Hall, G. ; Hansen, T.E. ; Roe, S. ; Wheadon, R.
Author_Institution :
Center for Industiforskning, Oslo, Norway
Volume :
36
Issue :
1
fYear :
1989
fDate :
2/1/1989 12:00:00 AM
Firstpage :
295
Lastpage :
299
Abstract :
A low-capacitance photodiode based on the principle of the solid-state drift chamber has been constructed and tested. The device is based on a cellular design with an anode at the center of each of five cells, allowing electrons liberated by ionization to drift up to 1 mm to the readout strip. Two designs were produced with p+ implant widths of 75 μm and 85 μm, respectively, using n-type material of 3.5-kΩ-cm resistivity. The opposite surface is a uniform p-type implant, features matching those of the other surface, and is unmetallized to ensure good photosensitivity. Results on the performance of the detector, including leakage current, capacitance, and drift properties, are presented and compared with simulation results
Keywords :
capacitance measurement; leakage currents; photodiodes; semiconductor counters; 75 mum; 85 mum; Si drift photodiode; capacitance; drift properties; leakage current; low-capacitance photodiode; photosensitivity; Anodes; Biological materials; Electrons; Implants; Ionization; Photodiodes; Silicon; Solid state circuits; Strips; Testing;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/23.34452
Filename :
34452
Link To Document :
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