DocumentCode :
1225940
Title :
Doping-type dependence of turn-on delay time in 1.3-μm InGaAsP-InP modulation-doped strained quantum-well lasers
Author :
Niwa, A. ; Ohtoshi, T. ; Uomi, K. ; Nakahara, K.
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
Volume :
8
Issue :
3
fYear :
1996
fDate :
3/1/1996 12:00:00 AM
Firstpage :
328
Lastpage :
330
Abstract :
The dependence of turn-on delay time on doping type in 1.3-μm InGaAsP-InP modulation-doped (MD) strained quantum-well (QW) lasers is theoretically investigated, based on the detailed band structure model including the band mixing effects. It is found that the turn-on delay time in n-type MD lasers is reduced to 1/4 that of undoped lasers due to both a lower threshold current and a reduced carrier lifetime. The reduction of the delay time is smaller in p-type MD lasers, however, because of the increased threshold current. These results show that the n-type MD-QW lasers are superior for high-speed modulation under zero-bias conditions.
Keywords :
III-V semiconductors; band structure; carrier lifetime; delays; gallium arsenide; gallium compounds; indium compounds; laser theory; optical modulation; quantum well lasers; semiconductor device models; semiconductor doping; 1.3 mum; InGaAsP-InP; InGaAsP-InP modulation-doped strained quantum-well lasers; band mixing effects; band structure model; doping-type dependence; high-speed modulation; lower threshold current; n-type MD lasers; n-type MD-QW lasers; reduced carrier lifetime; threshold current; turn-on delay time; zero-bias conditions; Charge carrier lifetime; Delay effects; Doping; Epitaxial layers; Laser modes; Laser theory; Quantum well lasers; Semiconductor process modeling; Spontaneous emission; Threshold current;
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/68.481106
Filename :
481106
Link To Document :
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