DocumentCode :
1228262
Title :
INDUCTWISE: inductance-wise interconnect simulator and extractor
Author :
Tsung-Hao Chen ; Luk, Clement ; Chen, Charlie Chung-Ping
Author_Institution :
Dept. of Electron. & Comput. Eng., Univ. of Wisconsin, Madison, WI, USA
Volume :
22
Issue :
7
fYear :
2003
fDate :
7/1/2003 12:00:00 AM
Firstpage :
884
Lastpage :
894
Abstract :
A robust, efficient, and accurate inductance extraction and simulation tool, INDUCTWISE, is developed and described in this paper. This work advances the state-of-the-art inductance extraction and simulation techniques, and has several major contributions. First, albeit the great benefits of efficiency, the recently proposed inductance matrix sparsification algorithm, the K-method of H. Ji et al. (2001), has a flaw in the stability proof for general geometry. We provide a theoretical analysis as well as a provable stable algorithm for it. Second, a robust window-selection algorithm is presented for general geometry. Third, integrated with the nodal analysis formulation, INDUCTWISE achieves exceptional performance without frequency-dependent complex operations and directly gives time-domain responses. Experimental results show that INDUCTWISE extractor and simulator have dramatic speedup compared to FastHenry and SPICE3, respectively.
Keywords :
circuit layout CAD; circuit simulation; inductance; integrated circuit interconnections; integrated circuit layout; integrated circuit modelling; matrix algebra; numerical stability; sparse matrices; INDUCTWISE; K-method; inductance extraction tool; inductance matrix sparsification algorithm; inductance simulation tool; inductance-wise interconnect extractor; inductance-wise interconnect simulator; linear complexity; nodal analysis formulation; on-chip inductance effect; on-chip parasitic modeling; robust window-selection algorithm; stable algorithm; time-domain responses; Circuit simulation; Crosstalk; Frequency; Geometry; Inductance; Integrated circuit interconnections; Large-scale systems; Robustness; Uncertainty; Very large scale integration;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2003.814260
Filename :
1208448
Link To Document :
بازگشت