• DocumentCode
    1229705
  • Title

    Modes of Failure of Electrical Connectors

  • Author

    Shearer, J.F.

  • Author_Institution
    The Pyle-National Company 1334 North Kostner Avenue Chicago 51, Illinois
  • Volume
    2
  • Issue
    2
  • fYear
    1964
  • fDate
    4/1/1964 12:00:00 AM
  • Firstpage
    558
  • Lastpage
    562
  • Abstract
    This paper discusses techniques for evaluating and predicting a connector´s performance by appling the principles of stress analysis to individual sub-assemblies which ultimately make up a complete, functioning connector. The author discusses the relationship of environment to material and surmises that the resultant of environmental conditions is stress in materials which may ultimately cause a failure in connector performance. In other words, a connector may be evaluated on the basis of the materials used therein and the ability of these materials to withstand the environmental conditions imposed upon them.
  • Keywords
    Assembly; Circuits; Conducting materials; Connectors; Contact resistance; Dielectrics; Failure analysis; Immune system; Seals; Stress;
  • fLanguage
    English
  • Journal_Title
    Aerospace, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0536-1516
  • Type

    jour

  • DOI
    10.1109/TA.1964.4319639
  • Filename
    4319639