DocumentCode :
123118
Title :
Direct finite-element-based solver for 3D-IC thermal analysis via H-matrix representation
Author :
Ying-Chi Li ; Tan, Sheldon X.-D ; Tan Yu ; Xin Huang ; Ngai Wong
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
fYear :
2014
fDate :
3-5 March 2014
Firstpage :
386
Lastpage :
391
Abstract :
We propose, for the first time, the use of hierarchical matrix (H-matrix) in the efficient finite-element-based (FE-based) direct solver implementation for both steady and transient thermal analyses of three-dimensional integrated circuits (3D ICs). H-matrix was shown to provide a data-sparse way to approximate the matrices and their inverses with almost linear space and time complexities. We show this is also true for FE-based transient analysis of thermal parabolic partial differential equations (PDEs). Specifically, we show that the stiffness matrix from a FE-based steady and transient thermal analysis can be represented by H-matrix without any approximation, and its inverse and Cholesky factors can be evaluated by H-matrix with controlled accuracy. We then show that the memory and time complexities of the solver are bounded by O(k1 N log N) and O(k12N log2 N), respectively, for very large scale thermal systems, where k is a small quantity determined by accuracy requirements and N is the number of unknowns in the system. Numerical results validate and demonstrate the effectiveness of the proposed method in terms of predicted theoretical scalability.
Keywords :
computational complexity; finite element analysis; integrated circuit modelling; matrix inversion; parabolic equations; partial differential equations; thermal analysis; three-dimensional integrated circuits; transient analysis; 3D-IC thermal analysis; Cholesky factors; FE- based transient analysis; FE-based steady thermal analysis; H-matrix representation; PDEs; direct finite-element-based solver; stiffness matrix; thermal parabolic partial differential equations; three-dimensional integrated circuits; time complexity; very large scale thermal systems; Accuracy; Complexity theory; Equations; Finite element analysis; Thermal analysis; Three-dimensional displays; Transient analysis; 3D IC; Finite element method; H-matrix; thermal analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quality Electronic Design (ISQED), 2014 15th International Symposium on
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4799-3945-9
Type :
conf
DOI :
10.1109/ISQED.2014.6783351
Filename :
6783351
Link To Document :
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