• DocumentCode
    123179
  • Title

    Automated methods for eliminating X bugs

  • Author

    Kai-Hui Chang ; Yen-Ting Liu ; Browy, Chris

  • Author_Institution
    Avery Design Syst., Inc., Andover, MA, USA
  • fYear
    2014
  • fDate
    3-5 March 2014
  • Firstpage
    597
  • Lastpage
    603
  • Abstract
    Unknown values (Xs) may exist in a design due to uninitialized registers or blocks that are powered down. Due to limitations known as X-optimism and X-pessimism, such Xs cannot be handled correctly in logic simulation, producing inaccurate simulation values that can mask X bugs or corrupt simulation results. This can cause X bugs to escape verification and reduces design quality. To resolve such X-related issues, we propose a comprehensive methodology and several novel methods to detect masked Xs at the register transfer level and eliminate false Xs at the gate level. Our case studies show that the proposed methods are both effective and efficient.
  • Keywords
    formal verification; logic simulation; X bugs elimination; X-optimism; X-pessimism; automated methods; design quality reduction; formal verification; gate level; logic simulation; register transfer level; Algorithm design and analysis; Analytical models; Computer bugs; Integrated circuit modeling; Logic gates; Maintenance engineering; Registers; X verification; formal verification; logic simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design (ISQED), 2014 15th International Symposium on
  • Conference_Location
    Santa Clara, CA
  • Print_ISBN
    978-1-4799-3945-9
  • Type

    conf

  • DOI
    10.1109/ISQED.2014.6783381
  • Filename
    6783381