DocumentCode
123204
Title
An energy-efficient mobile PAM memory interface for future 3D stacked mobile DRAMs
Author
Jalalifar, Majid ; Gyung-Su Byun
Author_Institution
Lane Dept. of Comput. Sci. & Electr. Eng., West Virginia Univ., Morgantown, WV, USA
fYear
2014
fDate
3-5 March 2014
Firstpage
675
Lastpage
680
Abstract
This paper presents a four-level pulse amplitude modulation (4-PAM) memory I/O interface for 3D stacked DRAMs. 3D integration technology is a promising solution for higher bandwidth and less power consumption due to the shortened link distance. The proposed transceiver is designed for 3D interconnects. The proposed transmitter employs a current mode output driver which sends data through TSVs. The receiver side uses differential amplifiers to decode three voltage levels by comparing the PAM signal with three reference voltages. The proposed scheme is simulated in 40 nm CMOS technology at 1.0 V. We use a highly accurate 3D electromagnetic (EM) simulator such as HFSS for 3D TSV channels simulations. The proposed architecture reduces the power consumption compared with prior works. It also increases the data bandwidth to 6.4 Gb/s/pin. Energy efficiency of proposed 3D mobile PAM I/O memory interface is 1.7 pJ/bit/pin.
Keywords
CMOS digital integrated circuits; DRAM chips; integrated circuit interconnections; pulse amplitude modulation; three-dimensional integrated circuits; 3D electromagnetic simulator; 3D integration technology; 3D interconnects; 3D stacked mobile DRAMs; CMOS technology; EM simulator; HFSS; TSV channels simulations; current mode output driver; differential amplifiers; energy-efficient mobile PAM memory interface; four-level pulse amplitude modulation memory I-O interface; link distance; reference voltages; size 40 nm; through-silicon-via simulations; voltage 1.0 V; voltage levels; Bandwidth; Mobile communication; Random access memory; Three-dimensional displays; Through-silicon vias; Transceivers; Transmitters; CMOS; mobile memory interface; pulse-amplitude modulation (PAM); through-silicon-via (TSV); transceiver;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design (ISQED), 2014 15th International Symposium on
Conference_Location
Santa Clara, CA
Print_ISBN
978-1-4799-3945-9
Type
conf
DOI
10.1109/ISQED.2014.6783392
Filename
6783392
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