Title :
Comparison of phase noise simulation techniques on a BJT LC oscillator
Author :
Forbes, Leonard ; Zhang, Chengwei ; Zhang, Binglei ; Chandra, Yudi
Author_Institution :
Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
fDate :
6/1/2003 12:00:00 AM
Abstract :
The phase noise resulting from white and flicker noise in a bipolar junction transistor (BJT) LC oscillator is investigated. Large signal transient time domain SPICE simulations of phase noise resulting from the random-phase flicker and white noise in a 2 GHz BJT LC oscillator have been performed and demonstrated. The simulation results of this new technique are compared with Eldo RF and Spectre RF based on linear circuit concepts and experimental result reported in the literature.
Keywords :
UHF oscillators; bipolar transistor circuits; circuit noise; circuit simulation; flicker noise; phase noise; time-domain analysis; transient analysis; white noise; 2 GHz; BJT LC oscillator; bipolar junction transistor oscillator; flicker noise; large signal SPICE simulations; phase noise simulation techniques; random-phase flicker; transient time domain SPICE simulations; white noise; 1f noise; Circuit noise; Circuit simulation; Mathematical model; Noise generators; Oscillators; Phase noise; Radio frequency; SPICE; White noise;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/TUFFC.2003.1209559
