• DocumentCode
    1233652
  • Title

    A Serpentine Guard Trace to Reduce the Far-End Crosstalk Voltage and the Crosstalk Induced Timing Jitter of Parallel Microstrip Lines

  • Author

    Lee, Kyoungho ; Lee, Hyun-Bae ; Jung, Hae-Kang ; Sim, Jae-Yoon ; Park, Hong-June

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Pohang Univ. of Sci. & Technol., Pohang
  • Volume
    31
  • Issue
    4
  • fYear
    2008
  • Firstpage
    809
  • Lastpage
    817
  • Abstract
    A serpentine guard trace is proposed to reduce the peak far-end crosstalk voltage and the crosstalk induced timing jitter of parallel microstrip lines on printed circuit boards. The vertical sections of the serpentine guard increase the mutual capacitance without much changing the mutual inductance between the aggressor and victim lines. This reduces the difference between the capacitive and inductive couplings and hence the far-end crosstalk. Comparison with the no guard, the conventional guard, and the via-stitch guard shows that the serpentine guard gives the smallest values in both the peak far-end crosstalk voltage and the timing jitter. The time domain reflectometer (TDR) measurement shows that the peak far-end crosstalk voltage of serpentine guard is reduced to 44% of that of no guard. The eye diagram measurement of pseudo random binary sequence (PRBS) data shows that the timing jitter is also reduced to 40% of that of no guard.
  • Keywords
    crosstalk; microstrip lines; printed circuits; random number generation; timing jitter; capacitive couplings; crosstalk induced timing jitter; eye diagram measurement; far-end crosstalk voltage; inductive couplings; mutual capacitance; parallel microstrip lines; printed circuit boards; pseudorandom binary sequence data; serpentine guard trace; time domain reflectometer measurement; Crosstalk; microstrip line; serpentine guard trace; timing jitter;
  • fLanguage
    English
  • Journal_Title
    Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3323
  • Type

    jour

  • DOI
    10.1109/TADVP.2008.924226
  • Filename
    4530751