DocumentCode
1233713
Title
Circuit optimization: the state of the art
Author
Bandler, John W. ; Chen, Shao Hua
Author_Institution
Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont., Canada
Volume
36
Issue
2
fYear
1988
fDate
2/1/1988 12:00:00 AM
Firstpage
424
Lastpage
443
Abstract
The authors review the current state of the art in circuit optimization, emphasizing techniques suitable for modern microwave CAD (computer-aided design). The main thrust in the field is currently the solution of realistic design and modeling problems, addressing such concepts as physical tolerances and model uncertainties. A unified hierarchical treatment of circuit models forms the basis of the presentation. It exposes tolerance phenomena at different parameter/response levels. The concepts of design centering, tolerance assignment, and postproduction tuning in relation to yield enhancement and cost reduction suitable for integrated circuits are discussed. Suitable techniques for optimization oriented worst-case and statistical design are reviewed. A generalized l p centering algorithm is proposed and discussed. Multicircuit optimization directed at both CAD and robust device modeling is formalized. Tuning is addressed in some detail, both at the design stage and for production alignment. State-of-the-art gradient-based nonlinear optimization methods are reviewed with emphasis given to recent, but well tested, advances in minimax, l 1, and l 2 optimization
Keywords
circuit CAD; microwave integrated circuits; network synthesis; optimisation; reviews; solid-state microwave circuits; MIC; circuit optimization; computer-aided design; cost reduction; design centering; gradient-based nonlinear optimization; integrated circuits; microwave CAD; minimax; model uncertainties; physical tolerances; postproduction tuning; review; robust device modeling; statistical design; tolerance assignment; yield enhancement; Circuit optimization; Costs; Design automation; Design optimization; Integrated circuit yield; Microwave theory and techniques; Optimization methods; Production; Robustness; Uncertainty;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.3532
Filename
3532
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