• DocumentCode
    1233713
  • Title

    Circuit optimization: the state of the art

  • Author

    Bandler, John W. ; Chen, Shao Hua

  • Author_Institution
    Dept. of Electr. & Comput. Eng., McMaster Univ., Hamilton, Ont., Canada
  • Volume
    36
  • Issue
    2
  • fYear
    1988
  • fDate
    2/1/1988 12:00:00 AM
  • Firstpage
    424
  • Lastpage
    443
  • Abstract
    The authors review the current state of the art in circuit optimization, emphasizing techniques suitable for modern microwave CAD (computer-aided design). The main thrust in the field is currently the solution of realistic design and modeling problems, addressing such concepts as physical tolerances and model uncertainties. A unified hierarchical treatment of circuit models forms the basis of the presentation. It exposes tolerance phenomena at different parameter/response levels. The concepts of design centering, tolerance assignment, and postproduction tuning in relation to yield enhancement and cost reduction suitable for integrated circuits are discussed. Suitable techniques for optimization oriented worst-case and statistical design are reviewed. A generalized lp centering algorithm is proposed and discussed. Multicircuit optimization directed at both CAD and robust device modeling is formalized. Tuning is addressed in some detail, both at the design stage and for production alignment. State-of-the-art gradient-based nonlinear optimization methods are reviewed with emphasis given to recent, but well tested, advances in minimax, l1, and l2 optimization
  • Keywords
    circuit CAD; microwave integrated circuits; network synthesis; optimisation; reviews; solid-state microwave circuits; MIC; circuit optimization; computer-aided design; cost reduction; design centering; gradient-based nonlinear optimization; integrated circuits; microwave CAD; minimax; model uncertainties; physical tolerances; postproduction tuning; review; robust device modeling; statistical design; tolerance assignment; yield enhancement; Circuit optimization; Costs; Design automation; Design optimization; Integrated circuit yield; Microwave theory and techniques; Optimization methods; Production; Robustness; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.3532
  • Filename
    3532