Title :
An Improved Method for Measuring Quartz Crystal Parameters
Author :
Williamson, Roger J.
Keywords :
Admittance measurement; Capacitance; Current measurement; Curve fitting; Electrical resistance measurement; Equivalent circuits; Frequency measurement; Optical wavelength conversion; Resonance; Voltage;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
DOI :
10.1109/T-UFFC.1987.27002
