• DocumentCode
    12364
  • Title

    Impact of the Oxide-Aperture Diameter on the Energy Efficiency, Bandwidth, and Temperature Stability of 980-nm VCSELs

  • Author

    Moser, Philip ; Lott, James A. ; Larisch, Gunter ; Bimberg, Dieter

  • Author_Institution
    Inst. of Solid State Phys., Tech. Univ. Berlin, Berlin, Germany
  • Volume
    33
  • Issue
    4
  • fYear
    2015
  • fDate
    Feb.15, 15 2015
  • Firstpage
    825
  • Lastpage
    831
  • Abstract
    New oxide-confined 980-nm vertical-cavity surface-emitting lasers (VCSELs) with record temperature-stable small-signal bandwidths of 25.6 to 23.0 GHz at 25 to 85 °C are designed, fabricated, and characterized. Technology-based device parameters essential for system-level models of VCSEL-based short-reach and ultrashort-reach optical interconnects are extracted. These parameters include key intrinsic figures-of-merit, including the -3-dB modulation bandwidth, the bandwidth-to-electrical power ratio, and device input impedance, all as functions of temperature, oxide-aperture diameter, and desired range of bias current or current density. Further, the M-factor, relating the intrinsic VCSEL bandwidth to the error-free bit rate for a given external systems configuration and application, is introduced. Our present 980-nm VCSEL technology is capable of 40 Gb/s operation at 85 °C at a simultaneously low current density of 10 kA/cm2 with an energy of only 100 fJ per bit.
  • Keywords
    current density; laser cavity resonators; optical interconnections; surface emitting lasers; M-factor; VCSEL; bandwidth 25.6 GHz to 23 Hz; bandwidth-to-electrical power ratio; bias current; bit rate 40 Gbit/s; current density; device input impedance; energy efficiency; error-free bit rate; laser bandwidth; oxide-aperture diameter; short-reach optical interconnects; temperature 25 degC to 85 degC; temperature stability; ultrashort-reach optical interconnects; vertical-cavity surface-emitting lasers; wavelength 980 nm; Apertures; Bandwidth; Bit rate; Energy efficiency; Modulation; Thermal stability; Vertical cavity surface emitting lasers; Energy efficiency; energy efficiency; green photonics; high speed modulation; optical interconnects; semiconductor lasers; vertical-cavity surface-emitting lasers;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2014.2365237
  • Filename
    6936848