Title :
Nonlinear response of Gd-Ba-Cu-O and Y-Ba-Cu-O microstrip resonators on sapphire
Author :
Zaitsev, A.G. ; Schneider, R. ; Linker, G. ; Tao, B.W. ; Ratzel, F. ; Smithey, R. ; Geerk, J.
Author_Institution :
Inst. fur Festkorperphysik, Forschungszentrum Karlsruhe, Germany
fDate :
6/1/2003 12:00:00 AM
Abstract :
HF power-induced nonlinear effects, including the two-tone intermodulation distortion (IMD), were examined by using 2.3 GHz microstrip resonators prepared from double-sided YBa2Cu3O7-x (YBCO) and GdBa2Cu3O7-x (GBCO) films on CeO2 buffered sapphire. Both, the YBCO and the GBCO resonators exhibited similarly high performance with low IMD level. The third-order interception points varied linearly with temperature from PTOI≈1500 W of the circulating power, Pcirc, at 4.2 K to PTOI≈90 W at 77.4 K. The dependence of the IMD products on the Pcirc/PTOI ratio was found to be the same at all measurement temperatures. Similarly, the variation of the microwave surface resistance ΔRS versus Pcirc/PTOI was found to be temperature-independent. The combination of these dependences provided a universal relation between the power of the IMD signals and ΔRS, which was exhibited by both YBCO and GBCO resonators in the entire examined temperature range.
Keywords :
high-temperature superconductors; intermodulation distortion; microstrip resonators; superconducting resonators; superconducting thin films; surface resistance; 1500 W; 2.3 GHz; 4.2 K; 77.4 K; 90 W; Gd-Ba-Cu-O; GdBaCuO; HF power-induced nonlinear effects; IMD products; Y-Ba-Cu-O; YBaCuO; circulating power; measurement temperatures; microstrip resonators; microwave surface resistance; nonlinear response; superconducting films; temperature range; third-order interception points; two-tone intermodulation distortion; Electrical resistance measurement; Hafnium; Intermodulation distortion; Microstrip resonators; Power measurement; Surface resistance; Temperature dependence; Temperature distribution; Temperature measurement; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2003.813729