• DocumentCode
    1237296
  • Title

    Quantum Boolean Circuits are 1-Testable

  • Author

    Chou, Yao-Hsin ; Tsai, I-Ming ; Kuo, Sy-Yen

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei
  • Volume
    7
  • Issue
    4
  • fYear
    2008
  • fDate
    7/1/2008 12:00:00 AM
  • Firstpage
    484
  • Lastpage
    492
  • Abstract
    Recently, a systematic procedure was proposed to derive a minimum input quantum circuit for any given classical logic with the generalized quantum Toffoli gate, which is universal in Boolean logic. Since quantum Boolean circuits are reversible, we can apply this property to build quantum iterative logic array (QILA). QILA can be easily tested in constant time (C-testable) if stuck-at fault model is assumed. In this paper, we use Hadamard and general controlled-controlled not gates to make QILA 1-testable. That is, for any quantum Boolean circuit, the number of test patterns is independent of both the size of the array and the length of the inputs.
  • Keywords
    Boolean algebra; iterative methods; quantum gates; Boolean logic; NOT gates; generalized quantum Toffoli gate; logic circuit; minimum input quantum circuit; quantum iterative logic array; stuck-at fault model; C-testable; Iterative logic array (ILA); M-testable; design for testability (DFT); iterative logic array (ILA); quantum circuit; quantum computation; reversible circuit;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2008.926369
  • Filename
    4531956